用于应用无损检测的未检测到的中红外光子的量子计量学
Quantum metrology with undetected mid-infrared photons for applied non-destructive testing
浏览论文内容
中文总结 AI 辅助
研究利用未检测到光子的量子计量学技术，基于自发参量下转换，应用量子非线性干涉仪进行中红外光谱、显微镜及光学相干断层扫描等无损检测，表征系统并与经典系统对比，展现该新技术前景。
中文摘要 AI 辅助
未检测到光子的计量学是一种新兴技术，它利用量子效应和光子相关性（纠缠），通过在易于访问的域（如可见光、近红外）中的测量，在目标光谱范围（如中红外）中检索有价值的信息。利用自发参量下转换（SPDC）的潜在量子过程来产生非简并相关信号光子和闲置光子，分别用作检测光子和探测光子。未检测到光子的传感具有重要优势，如超低探测功率、室温操作和散粒噪声限制检测。在本论文中，我们应用基于SPDC源的量子非线性干涉仪进行应用中红外光谱、中红外显微镜和中红外光学相干断层扫描（OCT），作为基于量子的常规无损检测最有前景的技术之一。此外，我们对系统进行了表征，与经典系统进行了基准测试，并为这项新技术提供了前瞻性展望。
英文摘要
Metrology with undetected photons is an emerging technique that leverages quantum effects and photon correlations (entanglement) to retrieve valuable information in a target spectral range (e.g., mid-infrared, mid-IR) using measurements in an easily accessible domain (e.g., visible, near-IR). The underlying quantum process of spontaneous parametric down-conversion (SPDC) is utilized to generate non-degenerate correlated signal and idler photons to serve as detection and probing photons, respectively. Sensing with undetected photons enables important advantages, such as ultra-low probe powers, room-temperature operation, and shot-noise-limited detection. In this contribution, we apply a quantum nonlinear interferometer based on an SPDC source to perform applied mid-IR spectroscopy, mid-IR microscopy, and mid-IR optical coherence tomography (OCT) as among the most promising techniques for quantum-based routine non-destructive testing. Moreover, we characterize the system, benchmark it against classical systems, and provide a prospective outlook for this new technology.
