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关于两比特门非局域特性的实验测定

On the Experimental Determination of Nonlocal Characteristics of Two-Qubit Gates

M. Karthick Selvan, S. Balakrishnan

arXiv 2607.11973首次发表:更新:

AI 中文总结

本文基于su(4)卡当子代数元素生成的两比特门的纠缠能力和门典型性表达式,构建量子电路来测量两比特门的这两种特性以确定其非局域特性,通过调整CNOT门数量减少测量纠缠能力的电路数量,且测量门典型性需更多非局域资源。

AI 中文摘要

在本文中,我们讨论了两比特门非局域特性的实验测定。基于最近推导出的两比特门纠缠能力和门典型性的表达式,我们构建两比特量子电路来测量由su(4)卡当子代数元素生成的两比特门的纠缠能力和门典型性,这些元素描述了许多量子处理器中的原生相互作用。我们构建了一组六个两比特电路测量纠缠能力,通过增加非局域资源(CNOT门数量)将电路数量减至三个。还构建了一组三个两比特电路测量门典型性,测量门典型性比测量纠缠能力需要更多非局域资源。

英文摘要

In this paper, we discuss the experimental determination of the nonlocal characteristics of two-qubit gates. Based on the recently derived expressions for the entangling power and gate typicality of two-qubit gates, we construct two-qubit quantum circuits to measure the entangling power and gate typicality of the two-qubit gates, which are generated by the elements of the su(4) Cartan subalgebra. These elements describe the native interactions in many quantum processors. Hence, these circuits can be used to determine the nonlocal characteristics of native gates of many quantum processors. In each circuit, the native gate is applied twice. In addition, each circuit consists of at least one CNOT gate. A set of six two-qubit circuits is constructed to measure the entangling power. The number of circuits is further reduced to three by increasing the nonlocal resources (the number of CNOT gates). To measure the gate typicality, a set of three two-qubit circuits is constructed. Measurement of gate typicality requires more nonlocal resources than the measurement of entangling power.

Comments7 pages. Research in progress. Comments are welcome

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