AI 中文总结
研究莫尔超晶格原子重构表征技术，综述提取几何相位的方法，比较多种技术，重点讨论布拉格干涉测量，通过案例展示其效用，强调该方法优势及挑战，突出材料高分辨率结构映射的相关要点。
AI 中文摘要
由二维材料扭曲和堆叠形成的莫尔超晶格的出现，使得需要能够在微米级视场中绘制亚埃原子重构的表征技术。本文综述了为在电子显微镜和X射线光谱中提取几何相位而开发的一系列方法，主要关注暗场中重叠布拉格反射的干涉。对一些既定技术进行了比较分析，包括几何相位分析、会聚束电子衍射全息术和各种叠层成像范式，最后讨论了用于测量莫尔材料中层间位移场和应变的布拉格干涉测量。通过扭曲双层和三层石墨烯以及过渡金属二硫属化物莫尔系统的案例研究，展示了布拉格干涉测量的实用性。特别关注这种暗场干涉测量方法在探测掩埋界面和封装异质结构方面的独特优势，以及在存在动态散射时解释不完整相位信息的固有挑战。通过研究这些方法的物理原理，本文强调了在材料高分辨率结构映射中涉及结构弛豫和电子行为相互作用的概念相似性和实际权衡，这一定义了现代凝聚态物理、纳米材料工程和界面化学交叉领域的科学前沿。
英文摘要
The emergence of moiré superlattices formed by twisting and stacking two-dimensional materials has created a need for characterization techniques capable of mapping sub-angstrom atomic reconstruction across micron-scale fields of view. This review surveys a suite of methodologies developed to extract geometric phases in electron microscopy and X-ray spectroscopy, with a primary focus on the interference of overlapping Bragg reflections in the dark field. We provide a comparative analysis of some established techniques, including geometric phase analysis, converged beam electron diffraction holography, and various ptychographic paradigms, culminating in a discussion of Bragg interferometry for measuring interlayer displacement fields and strain in moiré materials. We demonstrate the utility of Bragg interferometry through case studies of twisted bilayer and trilayer graphene as well as transition metal dichalcogenide moiré systems. Special attention is given to the unique advantages of this dark-field interferometric method for probing buried interfaces and encapsulated heterostructures, as well as the inherent challenges of interpreting incomplete phase information in the presence of dynamical scattering. By examining the physical principles underlying these approaches, this review highlights the conceptual similarities and practical trade-offs involved in high-resolution structural mapping of materials in which the interplay between structural relaxation and electronic behavior defines a scientific frontier at the nexus of modern condensed matter physics, nanomaterials engineering, and interfacial chemistry.
Comments39 pages, 8 figures
