真正的交流扫描隧道显微镜（ACSTM）：在绝缘体上进行隧道效应
True Alternating Current Scanning Tunneling Microscope (ACSTM): tunneling on insulators
AI总结：
本文提出一种基于真实交流电流的STM新方法，实现非导体表面如玻璃和氧化物的原子级成像，并提供高频电子信息。
摘要：
扫描隧道显微镜（STM）已革新了我们对表面的原子尺度理解，并加速了纳米技术的发展。然而，该技术受限于金属或半导体样品，因为它需要微小电流来以原子级精度稳定探针-样品距离。我们开发了一种新的成像和反馈方法，该方法依赖于真正的交流电流（AC）而不含任何直流（DC）成分。该技术不仅能够以原子分辨率成像非导体表面，如（薄）玻璃和氧化物，还提供了高频电子样品信息的访问。我们证明了在25nm厚的硅氧化物上以10 MHz隧道电流进行测量是可能的。
英文摘要：
Scanning Tunneling Microscopy (STM) has revolutionized our atomic scale understanding of surfaces and accelerated progress in nanotechnology. This technique, however, is restricted to metal or semiconducting samples, as it requires a tiny current to stabilize the tip-sample distance with atomic scale precision. We developed a new imaging and feedback method that relies on true alternating current (AC) without any direct current (DC) component. This technique does not only enable the imaging on non-conducting surfaces with atomic step resolution, like (thin) glass and oxides, it provides also access to high-frequency electronic signal coming from the sample. We demonstrate that it is possible to measure on 25nm thick silicon oxide with 10 MHz tunneling current.
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