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arXiv 2603.08040eess.SP
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堆叠智能超材料的层间误差校准:建模、算法与未来展望

Interlayer Error Calibration for Stacked Intelligent Metasurfaces:Modeling, Algorithms, and Future Perspectives

University of Electronic Science and Technology of China(电子科技大学);Yibin Institute of UESTC(电子科技大学宜宾研究院);Khalifa University(哈利法大学)

Xing Jia, Hao Liu, Haoxian Niu, Jinbao Li, Xiangyu Ding, Lu Gan

AI总结:

本文提出了一种多阶段校准方法,用于堆叠智能超材料中层间误差的校准,以提高实际传播系数的一致性。

摘要:

堆叠智能超材料(SIMs)最近 emerged 作为实现下一代无线网络中电磁波域信号处理的关键使能器。然而,实际的 SIM 实现往往由于制造和组装缺陷导致理论模型与测量响应之间存在明显的不匹配。本文系统地研究了 SIMs 中的层间误差校准问题。我们首先分类了代表性的建模和硬件引起的不完美之处。然后,我们概述了 SIM 校准中的主要挑战,并进一步开发了一个通用框架,该框架整合了校准协议与相关的解决方案策略。此外,我们研究了多阶段校准方法在缓解几何偏差和提高校准与实际传播系数之间对齐方面的有效性。最后,我们阐述了实现物理一致且硬件兼容的 SIM 实现的关键研究机会和实际挑战。

英文摘要:

Stacked intelligent metasurfaces (SIMs) have recently emerged as a key enabler for realizing electromagnetic wave-domain signal processing in next-generation wireless networks. However, practical SIM implementations often suffer from noticeable mismatches between theoretical models and measured responses due to fabrication and assembly imperfections. This article systematically investigates the problem of interlayer error calibration in SIMs. We first classify representative modeling and hardware-induced imperfections. Then, we outline the major challenges in SIM calibration and further develop a general framework that integrates a calibration protocol with the relevant solution strategies. Moreover, we investigate the effectiveness of the multi-stage calibration approach in mitigating geometric deviations and improving the alignment between the calibrated and practical propagation coefficients. Finally, we elaborate on key research opportunities and practical challenges toward realizing physically consistent and hardware-compliant SIM implementations for future research.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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