通过电子能损谱检测纳米尺度光学双折射的最优条件
Optimal conditions for detecting optical dichroism at the nanoscale by electron energy-loss spectroscopy
AI总结：
本文通过理论研究探讨了利用电子能损谱在纳米尺度检测光学双折射的最优条件，并分析了单扭螺线结构的最佳参数以获得稳健信号。
摘要：
光学圆双折射在手性纳米尺度和分子系统中的出现，不仅为分析样品自身手性提供了方法，还提供了操控光的额外自由度。这种操控甚至可以在纳米尺度实现；然而，探测和理解远低于衍射极限的光学场性质需要合适的技巧。基于轨道角动量（OAM）的电子态分选的电子能损谱（EELS）已被提出作为合适的候选者，但至今尚未有明确的实验结果。因此，我们理论上探讨了EELS中双折射的出现，针对一个典型的单扭螺线纳米结构，提出了获得稳健信号的最佳参数的详细分析。我们的工作为OAM分辨EELS信号的解释和波动性提供了新的见解，可以启发和指导未来的实验工作。
英文摘要：
The emergence of optical circular dichroism in chiral nanoscale and molecular systems provides not only a way for analyzing the sample chirality itself but also additional degrees of freedom in manipulating light. Such manipulation can be reached even at the nanoscale level; however, probing and understanding the properties of optical fields well below the diffraction limit requires an adequate technique. Electron energy-loss spectroscopy (EELS) with orbital angular momentum (OAM)-based electron state sorting has been suggested as a suitable candidate, but to date, no conclusive experiments have been performed. We, therefore, theoretically explore the emergence of dichroism in EELS for a canonical single-twist helix nanostructure and present a detailed analysis of the optimal parameters to obtain a robust signal. Our work offers novel insights into the interpretation and volatility of the OAM-resolved EELS signal, which can inspire and guide future experimental efforts.
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