基于强度测量的太赫兹多光谱极化成像
Terahertz multispectral polarimetric imaging based on intensity measurement
AI总结：
本文提出了一种基于强度测量的太赫兹极化成像方法，实现了对各向异性材料的高精度极化参数测量和成像。
摘要：
本文展示了一种紧凑型太赫兹（THz）极化光谱仪和成像系统，利用对极化敏感的频率选择表面（PS-FSS）和快速、基于强度的检测方法。实时提取斯托克斯参数能够实现线性极化角（AoLP）测量，并定量获取1毫米厚的x切割石英晶体的双折射率，此处作为各向异性样本的基准。提取的双折射率与基于太赫兹时域光谱的测量结果一致，验证了所提出的太赫兹极化方法的准确性。信号噪声比（SNR）在0.23-0.41 THz范围内达到87 dB，确保了在噪声底面之上可靠区分测量的光谱成分。将此方法扩展到使用不同PS-FSS取向（0°, 45°, 90°, 135°）的光栅扫描太赫兹成像，能够同时映射频率依赖的斯托克斯参数。所得到的线性极化度（DoLP）和AoLP图谱表现出良好的极化对比度，与数值模拟和独立可见光极化测量一致。该系统完全不使用场分辨检测或机械延迟阶段，提供了一个稳健且紧凑的平台，用于各向异性材料的太赫兹极化光谱和成像。
英文摘要：
A compact terahertz (THz) polarimetric spectrometer and imaging system is demonstrated using polarization-sensitive frequency-selective surfaces (PS-FSS) and rapid, intensity-based detection. Real-time Stokes parameter extraction enables angle-of-linear-polarization (AoLP) measurements and quantitative retrieval of the birefringence of a 1-mm-thick x-cut quartz crystal, used here as a benchmark anisotropic sample. The extracted birefringence is in good agreement with THz time domain spectroscopy-based measurements, validating the accuracy of the proposed THz polarimetric approach. Signal-to-noise ratios (SNR) up to 87 dB across 0.23-0.41 THz ensure reliable discrimination of the measured spectral components above the noise floor. Extending this approach to raster-scanned THz imaging using distinct PS-FSS orientations (0°, 45°, 90°, and 135°) enables simultaneous mapping of frequency-dependent Stokes parameters. The resulting degree of linear polarization (DoLP) and AoLP maps exhibit well-resolved polarimetric contrast, consistent with numerical simulations and independent visible polarimetric measurements. Operating entirely without field-resolved detection or mechanical delay stages, the system provides a robust and compact platform for THz polarimetric spectroscopy and imaging of anisotropic materials.
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