基于石墨烯-金属红外光电探测器的通用重构偏振测量
Universal reconstructive polarimetry with graphene-metal infrared photodetectors
AI总结：
本文提出利用常规栅控石墨烯-金属结实现红外重构偏振测量，通过门电压调节偏振对比度，实现光功率和偏振角的测量，并展示了其在不同结构和石墨烯质量下的通用性。
摘要：
近年来，智能光电探测器的出现，通过原位调节响应度，使单个设备能够重构光强度、偏振和光谱，革新了光电领域。迄今为止，大多数重构探测器采用非可扩展的范德瓦尔堆叠技术。本文展示了一种基于常规栅控石墨烯-金属结的红外重构偏振测量。重构利用门控偏振对比度，通过在两个不同门电压下的光电压测量，确定红外功率和偏振角。偏振测量的物理机制在于接触附近电子热点的偏振依赖性位移，以及光敏势垒宽度的门控。进一步，本文展示了偏振重构的通用性，即其在不同结几何结构和不同质量石墨烯（从氮化硼封装片到可扩展的化学气相沉积薄膜）中的可行性。
英文摘要：
Recent advent of smart photodetectors, where in-situ tuning of responsivity enables the reconstruction of light intensity, polarization and spectrum by a single device, has revolutionized the field of optoelectronics. So far, most such reconstructive detectors were realized with non-scalable technology of van der Waals stacking. Here, we demonstrate the infrared reconstructive polarimetry with photodetectors based on conventional gated graphene-metal junctions. The reconstruction exploits the gate tuning of polarization contrast, which enables the determination of both infrared power and polarization angle from photovoltage measurements at two different gate voltages. The physics enabling the polarimetry lies in polarization-dependent shift of the electron hot spot near the contact, and the gate tuning of photosensitive barrier width. We further show the universality of polarization reconstruction, i.e. its feasibility with different geometries of the junction, and with graphene of different quality, from boron-nitride encapsulated flakes to the scalable chemical vapor deposited films.
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