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arXiv 2511.02452stat.MLcs.LG
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标签稀缺下检测局部概念漂移的自适应采样框架

An Adaptive Sampling Framework for Detecting Localized Concept Drift under Label Scarcity

H. Milton Stewart School of Industrial & Systems Engineering(H. Milton Stewart工业与系统工程学院);Georgia Institute of Technology(佐治亚理工学院);EDF Trading(EDF交易)

Junghee Pyeon, Davide Cacciarelli, Kamran Paynabar

AI总结:

针对动态工业环境中标签稀缺和局部概念漂移问题,提出结合基于残差的探索与利用及EWMA监控的自适应采样框架,在标注预算约束下高效提升了漂移检测准确性与标签效率。

摘要:

概念漂移和标签稀缺是限制动态工业环境中预测模型鲁棒性的两大关键挑战。现有漂移检测方法通常假设全局偏移并依赖密集监督,使其不适用于具有局部漂移和有限标签的回归任务。本文提出一种自适应采样框架,结合基于残差的探索与利用以及EWMA监控,以在标注预算约束下高效检测局部概念漂移。在合成基准上的实验结果及电力市场的案例研究表明,该方法在标签效率和漂移检测准确性上表现出卓越性能。

英文摘要:

Concept drift and label scarcity are two critical challenges limiting the robustness of predictive models in dynamic industrial environments. Existing drift detection methods often assume global shifts and rely on dense supervision, making them ill-suited for regression tasks with local drifts and limited labels. This paper proposes an adaptive sampling framework that combines residual-based exploration and exploitation with EWMA monitoring to efficiently detect local concept drift under labeling budget constraints. Empirical results on synthetic benchmarks and a case study on electricity market demonstrate superior performance in label efficiency and drift detection accuracy.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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