用于双轴各向异性定量三维测量的非相干介电张量层析成像
Incoherent dielectric tensor tomography for quantitative 3D measurement of biaxial anisotropy
AI总结：
针对现有双轴各向异性三维测量技术需专用设施、破坏性制备等局限，提出非相干介电张量层析成像iDTT，结合偏振多样性与角谱调制实现亚微米分辨率无散斑抗振动的定量成像，经模拟实验验证，可用于多类材料无标记表征。
摘要：
双轴各向异性源于沿三个主方向的不同光学响应，是许多晶体、聚合物和生物材料复杂结构的基础。然而，X射线衍射、电子显微镜等现有技术需要专用设施或破坏性制备，且无法提供完整的三维（3D）信息。本文提出非相干介电张量层析成像（iDTT），这是一种非干涉式光学成像方法，可在非相干、偏振多样的照明下定量重建三维介电张量。通过结合偏振多样性与角谱调制，iDTT实现了无散斑、抗振动的双轴双折射成像，分辨率达亚微米级。对单轴和双轴样品的模拟与实验验证了其定量准确性。将iDTT应用于混合材料和多晶材料时，它可通过双折射特性区分晶体类型，并揭示三维晶粒取向和晶界。该方法使iDTT成为一种实用易用的工具，可对多种材料中的双轴各向异性进行无标记定量表征。
英文摘要：
Biaxial anisotropy, arising from distinct optical responses along three principal directions, underlies the complex structure of many crystalline, polymeric, and biological materials. However, existing techniques such as X-ray diffraction and electron microscopy require specialized facilities or destructive preparation and cannot provide full three-dimensional (3D) information. Here we introduce incoherent dielectric tensor tomography (iDTT), a non-interferometric optical imaging method that quantitatively reconstructs the 3D dielectric tensor under incoherent, polarization-diverse illumination. By combining polarization diversity and angular-spectrum modulation, iDTT achieves speckle-free and vibration-robust mapping of biaxial birefringence with submicron resolution. Simulations and experiments on uniaxial and biaxial samples validate its quantitative accuracy. Applied to mixed and polycrystalline materials, iDTT distinguishes crystal types by their birefringent properties and reveals 3D grain orientations and boundaries. This approach establishes iDTT as a practical and accessible tool for quantitative, label-free characterization of biaxial anisotropy in diverse materials.
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