ZaP-HD剪切流稳定Z箍缩装置上石墨电极侵蚀的光谱测量
Spectroscopic measurements of graphite electrode erosion on the ZaP-HD sheared-flow-stabilized Z-pinch device
AI总结：
本研究在ZaP-HD剪切流稳定Z箍缩装置上利用C-III的S/XB光谱方法测量石墨电极侵蚀，发现通量达10^30–10^31 atoms m^-2 s^-1，主要源于升华而非物理溅射。
摘要：
每光子电离数（S/XB）方法利用对辐射杂质离子的光谱测量来确定来自固体表面的入流通量。作为一种非扰动、原位测量面向等离子体部件（PFC）总侵蚀通量的手段，该方法非常有用。在剪切流稳定（SFS）Z箍缩装置中，电极提供等离子体电流，并直接接触核心Z箍缩等离子体。由巨大粒子通量和热通量引起的电极侵蚀会影响电极耐久性，这是现有和未来装置中的一个重要因素。尤其随着能量密度提高，需要进一步认识这些等离子体-电极相互作用。ZaP-HD装置上的实验通过将S/XB方法应用于229.7 nm处的C-III发射，研究石墨电极的侵蚀。S/XB系数由数字全息干涉测量（DHI）获得的电子密度和温度剖面确定。文中描述了一种扩展这些剖面以表征与电极接触等离子体的方法。在两种情况下，测得的侵蚀通量均为10^30–10^31 atoms m^-2 s^-1量级。这些数值显著大于H+离子对碳的物理溅射所产生的预期侵蚀通量，但与理论升华通量相当。这表明碳侵蚀通量的来源主要是升华，而非溅射。升华相对于溅射过程占主导意味着被侵蚀中性粒子的能量存在差异，这或可为再沉积和净侵蚀行为提供认识。
英文摘要：
The ionizations per photon, or S/XB, method uses spectroscopic measurements of radiating impurity ions to determine the influx from a solid surface. It is highly useful as a non-perturbing, in-situ measure of the gross erosion flux of plasma-facing components (PFCs). In sheared-flow-stabilized (SFS) Z-pinch devices, the electrode supplies the plasma current and directly contacts the core Z-pinch plasma. Electrode erosion due to the large particle and heat fluxes affects electrode durability, which is an important factor in existing and future devices. An improved understanding of these plasma-electrode interactions is required, in particular as energy density increases. Experiments on the ZaP-HD device investigate erosion of the graphite electrode by applying the S/XB method for C-III emission at 229.7 nm. The S/XB coefficients are determined from electron density and temperature profiles obtained from Digital Holographic Interferometry (DHI) measurements. An approach for expanding these profiles to represent plasma contacting the electrode is described. In both cases, the measured erosion fluxes are on the order of 10$^{30}$-10$^{31}$ atoms m$^{-2}$s$^{-1}$. These values are significantly larger than the expected erosion flux due to physical sputtering of H$^+$ ions on carbon, but are comparable to theoretical sublimation fluxes. This suggests that the source of carbon erosion flux is primarily from sublimation as opposed to sputtering. The dominance of sublimation over sputtering processes implies a difference in energy of the eroded neutrals which may provide insight on redeposition and net erosion behavior.
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