利用单电荷灵敏的SuperCDMS-HVeV探测器搜索低质量电子 recoil暗物质
Search for low-mass electron-recoil dark matter using a single-charge sensitive SuperCDMS-HVeV Detector
AI总结：
该研究利用SuperCDMS-HVeV探测器在地下设施中获取数据，对低质量暗物质电子散射和吸收相互作用进行约束，得出暗物质-电子散射截面及光子-暗光子混合参数的排除限。
摘要：
我们利用SuperCDMS高电压eV分辨率（HVeV）探测器对低质量暗物质的电子散射和吸收相互作用进行了约束。数据在费米实验室地下NEXUS设施中获取，覆盖层为225米水当量。实验受益于探测器支架中印刷电路板发光的最小化，采用盲分析方法对6.1克·天的暴露量数据进行处理，得出暗物质-电子散射截面在质量低至1 MeV/c²时的排除限，以及通过吸收过程探测质量大于1.2 eV/c²的轴子状粒子与电子耦合常数和光子-暗光子混合参数的限制。
英文摘要：
We present constraints on low-mass dark matter electron scattering and absorption interactions using a SuperCDMS high-voltage eV-resolution (HVeV) detector. Data were taken underground in the NEXUS facility located at Fermilab with an overburden of 225 meters of water equivalent. The experiment benefits from the minimizing of luminescence from the printed circuit boards in the detector holder used in all previous HVeV studies. A blind analysis of $6.1\,\mathrm{g\cdot days}$ of exposure produces exclusion limits for dark matter-electron scattering cross sections for masses as low as $1\,\mathrm{MeV}/c^2$, as well as on the photon-dark photon mixing parameter and the coupling constant between axionlike particles and electrons for particles with masses $>1.2\,\mathrm{eV}/c^2$ probed via absorption processes.
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