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arXiv 2503.09554quant-phcond-mat.supr-con
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超导量子比特中仅由声子事件引起的关联准粒子毒化

Correlated quasiparticle poisoning from phonon-only events in superconducting qubits

E. Yelton, C. P. Larson, K. Dodge, K. Okubo, B. L. T. Plourde

AI总结:

该研究通过多次冷却实验发现超导量子比特中关联准粒子毒化事件随时间幂律下降而偏移电荷变化率恒定,揭示其源于非电离的拆对声子爆发,并指出热致应力弛豫可能是诱因。

摘要:

在多次冷却循环过程中,我们观察到多量子比特关联毒化事件的发生率随时间呈幂律下降,而量子比特偏移电荷的变化率保持恒定;这为超导量子比特中存在非电离源的拆对声子爆发提供了证据。我们研究了不同类型的样品封装方式,其中一些对低温冷却器脉冲管的机械冲击敏感。这些事件的一个可能来源是器件层与衬底之间差分热收缩引起的热致应力弛豫。

英文摘要:

Throughout multiple cooldowns we observe a power-law reduction in time for the rate of multi-qubit correlated poisoning events, while the rate of shifts in qubit offset-charge remains constant; evidence of a non-ionizing source of pair-breaking phonon bursts for superconducting qubits. We investigate different types of sample packaging, some of which are sensitive to mechanical impacts from the cryocooler pulse tube. One possible source of these events comes from relaxation of thermally-induced stresses from differential thermal contraction between the device layer and substrate.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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