利用超低阈值传感器在电子束流收集器中探测毫电荷粒子
Probing Millicharged Particles at an Electron Beam Dump with Ultralow-Threshold Sensors
AI总结：
提出利用Skipper-CCD超低阈值传感器在电子束流收集器中探测毫电荷粒子，发现其灵敏度可超越现有搜寻并增强加速器实验的探测范围。
摘要：
我们提出利用小型超低阈值传感器，在高强度电子束流收集器中搜寻产生的毫电荷粒子。作为一个具体实例，我们考虑放置在杰斐逊实验室（Jefferson Lab）A厅束流收集器后方的Skipper-CCD。我们计算了毫电荷粒子通量，包括来自铝靶的电磁级联和介子产生两部分。我们发现，一个适中的2x14阵列的Skipper-CCD，对于1.5 GeV以下的毫电荷粒子质量，其灵敏度可超越所有现有搜寻，且与其他拟议实验相比具有竞争力或处于世界领先水平。我们的结果表明，小型超低阈值硅器件可以增强基于加速器的实验的探测范围，同时能轻松安置于现有的实验厅内。
英文摘要：
We propose to search for millicharged particles produced in high-intensity electron beam dumps using small ultralow-threshold sensors. As a concrete example, we consider a Skipper-CCD placed behind the beam dump in Hall A at Jefferson Lab. We compute the millicharged particle flux, including both electromagnetic cascade and meson productions emanating from an aluminum target. We find that the sensitivity of a modest 2x14 array of Skipper-CCDs can exceed the sensitivity of all existing searches for millicharged particle masses below 1.5 GeV, and is either competitive or world leading when compared to other proposed experiments. Our results demonstrate that small-scale ultralow threshold silicon devices can enhance the reach of accelerator-based experiments, while fitting comfortably within existing experimental halls.
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