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arXiv 2411.16767cs.CVcs.AI

背景感知的缺陷生成用于鲁棒的工业异常检测

Background-Aware Defect Generation for Robust Industrial Anomaly Detection

Youngjae Cho, Gwangyeol Kim, Sirojbek Safarov, Seongdeok Bang, Jaewoo Park

AI总结:

针对工业异常检测中标记数据稀缺和背景-缺陷交互建模不足的问题,提出背景感知缺陷生成框架,利用解耦损失和DDIM反演实现可控合成,在MVTec AD和Loco基准上验证了生成质量与检测性能的优越性。

摘要:

在工业环境中检测异常具有挑战性,因为标记的异常数据稀缺。生成模型可以通过合成逼真的缺陷样本来缓解这一问题,但现有方法往往无法建模缺陷与其背景之间的关键相互作用。这种疏忽导致生成的异常不真实,尤其是在上下文一致性至关重要的场景中(即逻辑异常)。为解决此问题,我们提出了一种新颖的背景感知缺陷生成框架,其中背景影响缺陷去噪而不影响背景本身,通过确保逼真的合成同时保持结构完整性。我们的方法利用解耦损失将背景的去噪过程与缺陷分离,从而通过DDIM反演实现可控的缺陷合成。我们从理论上证明,我们的方法在生成上下文准确的缺陷时保持了背景保真度。在MVTec AD和MVTec Loco基准上的大量实验验证了我们的方法在缺陷生成质量和异常检测性能方面均优于现有技术。

英文摘要:

Detecting anomalies in industrial settings is challenging due to the scarcity of labeled anomalous data. Generative models can mitigate this issue by synthesizing realistic defect samples, but existing approaches often fail to model the crucial interplay between defects and their background. This oversight leads to unrealistic anomalies, especially in scenarios where contextual consistency is essential (i.e., logical anomaly). To address this, we propose a novel background-aware defect generation framework, where the background influences defect denoising without affecting the background itself by ensuring realistic synthesis while preserving structural integrity. Our method leverages a disentanglement loss to separate the background' s denoising process from the defect, enabling controlled defect synthesis through DDIM Inversion. We theoretically demonstrate that our approach maintains background fidelity while generating contextually accurate defects. Extensive experiments on MVTec AD and MVTec Loco benchmarks validate our mehtod's superiority over existing techniques in both defect generation quality and anomaly detection performance.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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