欧洲XFEL闪烁屏点扩散函数的精确模拟
Accurate simulation of the European XFEL scintillating screens point spread function
AI总结：
针对欧洲XFEL闪烁屏因厚度、观测角度和物镜像差导致的分辨率下降问题，研究实现了光学系统全畸变点扩散函数的精确模拟，并提出将PSF纳入高斯束形拟合函数的分辨率提升方法。
摘要：
欧洲X射线自由电子激光装置（European XFEL）配备有闪烁屏作为束流剖面测量监测器，所用闪烁材料为掺铈钆铝镓石榴石（Gadolinium Aluminium Gallium Garnet doped with Cerium, GAGG:Ce）。在大多数站点中，闪烁屏垂直于电子束放置，以背向角度观测闪烁光。闪烁体厚度通常为200微米，由于可观测到粒子在闪烁体内的完整径迹，带角度的平面内分辨率会变差，此外所用物镜还会引入像差。本研究概述了由光学系统所有畸变导致的点扩散函数（point spread function, PSF）的精确模拟，还提出一种在假设束流为高斯形的前提下，将PSF纳入拟合函数以提升屏幕分辨率的方法。
英文摘要：
The European XFEL is equipped with scintillating screens as a profile measurement monitor. The scintillating material used is Gadolinium Aluminium Gallium Garnet doped with Cerium (GAGG:Ce). At most of the stations, the screen is positioned perpendicular to the electron beam, with scintillation observed at a backward angle. The scintillator thickness is usually 200 um, making the resolution worse in the plane with the angle, as it allows for the entire particle track within the scintillator to be seen. Besides, aberrations are introduced by the objective used. This study outlines an accurate simulation of the point spread function (PSF) caused by all distortions of the optical system and, in addition, a method to improve the screens resolution by including the PSF into a fitting function, assuming a Gaussian beam shape.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
