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arXiv 2409.11207physics.ins-det
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扫描微波显微镜阻抗匹配网络的比较

Comparison of Impedance Matching Networks for Scanning Microwave Microscopy

Johannes Hoffmann, Sophie de Preville, Bruno Eckmann, Hung-Ju Lin, Benedikt Herzog, Kamel Haddadi, Didier Theron, Georg Gramse, Damien Richert, Jose Moran-Meza, Francois Piquemal

AI总结:

该研究提出了扫描微波显微镜阻抗匹配网络增益与附加噪声的通用定义,对比了多种阻抗匹配器件性能,测得最高28 GHz下最大增益达9504.7每西门子,为不同匹配技术的独立比较提供了方法。

摘要:

本文给出了扫描微波显微镜阻抗匹配网络的增益与附加噪声的定义。该定义可用于比较不同阻抗匹配技术,且不受测量S参数所用仪器的限制。作为验证,研究了由Beatty线、调谐器以及带放大器和不带放大器的干涉式装置构成的阻抗匹配器件。实验采用最高28 GHz的测量频率,测得的最大增益为9504.7每西门子。

英文摘要:

In this paper, a definition of the gain and added noise of impedance matching networks for scanning microwave microscopy is given. This definition can be used to compare different impedance matching techniques independently of the instrument used to measure the S-parameter. As a demonstration, impedance matching devices consisting of a Beatty line, a tuner, and interferometric setups with and without amplifiers have been investigated. Measurement frequencies up to 28 GHz are used, and the maximal resulting gain found was 9504.7 per Siemens.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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