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arXiv 2409.04771cond-mat.mtrl-scicond-mat.mes-hall
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暗场紫外光发射电子显微镜中的增强磁二向色性

Enhanced magnetic dichroism in darkfield UV photoemission electron microscopy

Maximilian Paleschke, David Huber, Friederike Wührl, Cheng-Tien Chiang, Frank O. Schumann, Jürgen Henk, Wolf Widdra

AI总结:

本文提出暗场紫外 PEEM 方法以增强阈值光发射中的 MCD 衬度,在 Fe(001) 上实现一个数量级提升,为飞秒激光 MCD 成像奠定基础。

摘要:

光发射电子显微镜(PEEM)已发展成为纳米尺度表面结构与磁表征不可或缺的工具。与基于同步辐射的 X 射线 PEEM 形成鲜明对比的是,后者是通过磁圆二向色性(MCD)研究元素特异性磁性质的领先方法,而实验室紫外(UV)PEEM 的应用仍然有限,并且对面内磁化产生的二向色性效应小得多。在此,我们引入暗场 PEEM 作为增强阈值光发射中 MCD 衬度的新方法,实现了高效 MCD 成像,并使 Fe(001) 的衬度显著增强一个数量级。这一进展为利用现代激光在飞秒时间尺度上进行 MCD 成像铺平了道路。实验结果将依据先进的相对论性光发射计算进行定量基准检验。

英文摘要:

Photoemission electron microscopy (PEEM) has evolved into an indispensable tool for structural and magnetic characterization of surfaces at the nanometer scale. In strong contrast to synchrotron-radiation-based X-ray PEEM as a leading method for element-specific magnetic properties via magnetic circular dichroism (MCD), laboratory ultraviolet (UV) PEEM has seen limited application with much smaller dichroism effects for in-plane magnetization. Here we introduce darkfield PEEM as a novel approach to enhance MCD contrast in threshold photoemission, enabling efficient MCD imaging with significantly enhanced contrast by an order-of-magnitude for Fe(001). This advancement paves the way for MCD imaging on femtosecond timescales using modern lasers. The experimental results will be quantitatively benchmarked against advanced relativistic photoemission calculations.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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