用于降低具有有限屏厚度的高过模太赫兹光阑线中损耗的凿边屏
Chisel-edged screens to reduce loss in highly overmoded THz iris lines with finite screen thickness
AI总结：
本文研究了高过模太赫兹光阑线波导中屏厚度对衍射损耗和欧姆损耗的影响，并提出凿边屏几何变体以在较厚屏条件下限制欧姆损耗增长。
摘要：
在本说明中，我们报告了关于由薄屏构成的高过模太赫兹光阑线波导中衍射功率损耗和欧姆功率损耗随屏厚度变化的增长趋势的观测结果。近期的理论发展给出了详细的场描述，包括本征分析和瞬态分析，刻画了此类波导在傍轴偶极模激发下的特性。基于这些分析，我们能够更好地估计——并最小化——实际实现中由有限屏厚度引起的功率损耗效应。我们提出了一种几何变体，借此限制欧姆损耗的增长趋势，即使在实际中使用相对较厚的屏时也是如此。
英文摘要：
In this note we report observations on the growth trends of diffraction power loss and ohmic power loss, as functions of screen thickness, in highly overmoded THz iris-line waveguides that are constructed from thin screens. Recent theoretical developments have given a detailed field description, including eigen and transient analyses, that characterizes such waveguides under paraxial dipole-mode excitation. Informed by these analyses, we can better estimate -- and minimize -- power loss effects due to finite screen thickness in practical realizations. A geometric variation is proposed whereby we limit the growth trend in ohmic loss, even when using relatively thicker screens in practice.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
