环形X射线光学器件为辐射敏感样品提供更优分辨率
Annular x-ray optics offer superior resolution for radiation sensitive samples
AI总结：
本文提出在扫描X射线显微术中使用环形光学器件替代全孔径光学器件，在降低辐射剂量的同时保持对小尺寸特征的分辨能力，并通过数值模拟验证其优越性。
摘要：
高分辨率X射线显微术需要高光子通量来测量弱散射样品的信号。这会使样品暴露于高辐射剂量下，可能通过辐射损伤使其受损或毁坏。在本工作中，我们提出在扫描显微术中使用环形光学器件作为全孔径光学器件的替代方案。环形光学器件起到高通滤波器的作用。与具有相同数值孔径的常规光学器件相比，环形光学器件使样品暴露于更低的剂量，同时从小尺寸样品特征产生相同的信号。环形光学器件显著受益于最新X射线源的高光子通量，以补偿其整体较小的截面。通过数值模拟，我们表明环形光学器件对于接近光学器件分辨率极限的样品特征提供更优的光学性能。
英文摘要：
High-resolution x-ray microscopy requires a high photon flux to measure the signal from weakly scattering samples. This exposes samples to high radiation doses, potentially damaging or destroying them through radiation damage. In this work, we propose the use of annular optics in scanning microscopy as an alternative to full-aperture optics. Annular optics act as high-pass filters. Compared to regular optics with the same numerical aperture, annular optics expose the sample to less dose while producing the same signal from small sample features. Annular optics benefit significantly from the high photon fluxes of the latest x-ray sources to compensate for their overall smaller cross section. Using numerical simulations, we show that annular optics offer superior optical performance for sample features close to the resolution limit of the optic.
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