KATRIN实验偏移分析平面中电势和磁场的测量
Measurement of the electric potential and the magnetic field in the shifted analysing plane of the KATRIN experiment
AI总结:
本文针对KATRIN实验背景电子影响中微子质量测量灵敏度的问题,开发了偏移分析平面(SAP)配置以将背景减少一半,并利用气态83mKr转换电子对复杂电磁场进行校准测量,从而支持SAP配置下的中微子质量测量。
摘要:
KATRIN实验有效电子中微子质量测量的预期灵敏度在五年数据采集后低于0.3 eV(90% CL)。该灵敏度受到KATRIN主谱仪背景电子增加率的影响。开发了一种特殊的偏移分析平面(SAP)配置,可将该背景减少一半。SAP配置中电磁场的复杂布局需要一种稳健的方法来估计这些场。本文介绍了使用气态83mKr的转换电子对场进行专门校准测量的结果,这使得在SAP配置下进行中微子质量测量成为可能。
英文摘要:
The projected sensitivity of the effective electron neutrino-mass measurement with the KATRIN experiment is below 0.3 eV (90 % CL) after five years of data acquisition. The sensitivity is affected by the increased rate of the background electrons from KATRIN's main spectrometer. A special shifted-analysing-plane (SAP) configuration was developed to reduce this background by a factor of two. The complex layout of electromagnetic fields in the SAP configuration requires a robust method of estimating these fields. We present in this paper a dedicated calibration measurement of the fields using conversion electrons of gaseous $^\mathrm{83m}$Kr, which enables the neutrino-mass measurements in the SAP configuration.
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