ILC上利用小角度Bhabha散射进行积分亮度测量的计量学要求
Metrology requirements for the integrated luminosity measurement using small angle Bhabha scattering at ILC
AI总结：
本文针对未来Higgs工厂的积分亮度精确测量需求，利用小角度Bhabha散射，回顾了ILC在91.2 GeV至1 TeV等多种质心能量下实现目标精度所需的计量学要求。
摘要：
未来Higgs工厂（包括ILC）的积分亮度$\mathcal{L}$精确测量，对于截面测量，特别是Z极点处的线型测量至关重要。由于目前尚无ILC上由计量学效应引起的积分亮度不确定性的最新估计，本文利用小角度Bhabha散射，回顾了在预见的ILC质心能量：91.2 GeV、250 GeV、500 GeV和1 TeV下，为实现$\mathcal{L}$目标精度所需的计量学要求。
英文摘要：
Precision measurement of the integrated luminosity $\mathcal{L}$ at future Higgs factories, including ILC, is of crucial importance for the cross-section measurements, and in particular for the line-shape measurements at the Z-pole. Since there is no up-to-date estimate of the integrated luminosity uncertainties arising from metrology effects at ILC, here we review the metrology requirements for the targeted precision of $\mathcal{L}$ at foreseen ILC center-of-mass energies: 91.2 GeV, 250 GeV, 500 GeV and 1 TeV, using small-angle Bhabha scattering.
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