铁电向列相材料的介电性质：极化-电容戈德斯通模式的定量检验
Dielectric properties of a ferroelectric nematic material: quantitative test of the polarization-capacitance Goldstone mode
AI总结：
本文通过改变绝缘层厚度的介电谱测量，定量验证了铁电向列相液晶中观测到的巨介电常数实为电极表面绝缘层电容的模型，并粗略估计了NF相的垂直介电常数。
摘要：
最近发现的铁电向列相（NF）液晶（LC）据报道在低频下表现出异常大的介电常数实部值。然而，Clark 等人在 Physical Review Research 6, 013195 (2024) 中指出，所测得的实际上是液晶/电极表面绝缘层的电容，而非液晶本身的电容。本文描述了在绝缘层厚度可变的液晶盒中对 NF 材料进行介电谱测量的结果。我们的测量定量验证了 Clark 等人提出的模型。此外，我们在具有裸露导电氧化铟锡表面的液晶盒中的测量提供了 NF 相中 epsilon 垂直分量约为 100 的粗略估计。
英文摘要：
The recently discovered ferroelectric nematic (NF) liquid crystals (LC) have been reported to show an extraordinarily large value of the real part of the dielectric constant at low frequencies. However, it was argued by Clark et al in Physical Review Research 6, 013195 (2024) that what was measured was the capacitance of the insulating layer at LC/electrode surface and not that of the liquid crystal. Here we describe the results of dielectric spectroscopy measurements of an NF material in cells with variable thickness of the insulating layers. Our measurements quantitatively verify the model by Clark et al. Additionally, our measurements in cells with bare conducting indium tin oxide surface provide a crude estimate of epsilon perpendicular~100 in the NF phase.
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