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arXiv 2406.00501cs.CVcs.LG
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基于扩散模型的表面缺陷检测中分布内数据增强

Diffusion-based Image Generation for In-distribution Data Augmentation in Surface Defect Detection

University of Verona(维罗纳大学);Department of Engineering for Innovation Medicine(创新医学工程学院)

Luigi Capogrosso, Federico Girella, Francesco Taioli, Michele Dalla Chiara, Muhammad Aqeel, Franco Fummi, Francesco Setti, Marco Cristani

AI总结:

提出In&Out方法,利用扩散模型生成分布内缺陷数据并与分布外数据混合,在零样本、少样本和全样本设置下增强表面缺陷检测,在Kolektor Surface-Defect Dataset 2上达到.782的AP分数。

摘要:

在本研究中,我们展示了扩散模型可以应用于工业场景,以改善表面缺陷检测背景下的数据增强过程。通常,缺陷检测分类器是在由正常样本(负数据)和带缺陷样本(正数据)组成的真实数据上训练的,其中后者始终少于正常样本。由于这些原因,最先进的数据增强方法通过将伪影叠加到正常样本来添加合成缺陷数据。这会导致分布外的增强数据,使得分类系统学到了什么不是正常样本,但不知道真正的缺陷是什么。我们展示了扩散模型克服了这一情况,提供了更真实的分布内缺陷,使得模型能够学习缺陷的真实外观。我们提出了一种新颖的数据增强方法,将分布外样本与分布内样本混合,我们称之为In&Out。该方法可以处理两种数据增强设置:i)当没有缺陷可用时(零样本数据增强)以及ii)当缺陷可用时,可以是少量(少样本)或大量(全样本)。我们将实验部分集中在最先进的最具挑战性的基准上,即Kolektor Surface-Defect Dataset 2,在弱监督下定义了新的最先进分类AP分数.782。代码可在https://github.com/intelligolabs/in_and_out获取。

英文摘要:

In this study, we show that diffusion models can be used in industrial scenarios to improve the data augmentation procedure in the context of surface defect detection. In general, defect detection classifiers are trained on ground-truth data formed by normal samples (negative data) and samples with defects (positive data), where the latter are consistently fewer than normal samples. For these reasons, state-of-the-art data augmentation procedures add synthetic defect data by superimposing artifacts to normal samples. This leads to out-of-distribution augmented data so that the classification system learns what is not a normal sample but does not know what a defect really is. We show that diffusion models overcome this situation, providing more realistic in-distribution defects so that the model can learn the defect's genuine appearance. We propose a novel approach for data augmentation that mixes out-of-distribution with in-distribution samples, which we call In&Out. The approach can deal with two data augmentation setups: i) when no defects are available (zero-shot data augmentation) and ii) when defects are available, which can be in a small number (few-shot) or a large one (full-shot). We focus the experimental part on the most challenging benchmark in the state-of-the-art, i.e., the Kolektor Surface-Defect Dataset 2, defining the new state-of-the-art classification AP score under weak supervision of .782. The code is available at https://github.com/intelligolabs/in_and_out.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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