基于SOI像素探测器结合同步辐射X射线的钢材精细残余应力分布测量
Fine residual stress distribution measurement of steel materials by SOI pixel detector with synchrotron X-rays
AI总结：
本研究基于搭载INTPIX4 SOI像素探测器的$cos α$法残余应力测量系统，利用同步辐射X射线实现钢材残余应力的精细分布测量，验证了其高精度、小采样间距的测量能力，且测量效率远高于传统方法。
摘要：
残余应力是工业产品中金属材料质量评估与质量控制的关键影响因素。X射线测量是目前实现残余应力无损评估的最有效手段之一，在这类测量中，残余应力对晶体结构的作用可通过德拜环（Debye ring）的形变被观测到。\n 在前期研究中，我们基于$cos α$法开发了一套残余应力测量系统，该系统采用名为INTPIX4的二维（2D）绝缘体上硅像素（SOIPIX，silicon-on-insulator pixel）探测器。在常规实验室配置下，该系统仅需1秒即可完成单个指定点的测量，测量速度大幅提升：传统基于$sin^{2} ψ$法的系统测量需耗时10分钟以上，采用成像板的$cos α$法系统则需1分钟。与其他系统相比，该系统能更快完成残余应力的二维分布评估，可为材料评估提供更详尽的信息。我们最初尝试在配备Cr X射线管（Cr K$α$ 5.4 keV）的实验室装置中测量二维分布，并取得了理想结果。随后我们使用同步辐射单色X射线开展测量，以获取高精度、小采样间距的精细分布。本文报道了首次同步辐射实验的结果，包括通过首套原型装置测得的标准试样残余应力分布，此外还将同步辐射测量结果与实验室测量结果进行了对比。
英文摘要：
Residual stress is an important factor governing evaluating and controlling the quality of metal materials in industrial products. X-ray measurements provide one of the most effective means of evaluating residual stress without destruction. In such measurements, the effects of residual stress on the crystal structure can be observed through the Debye ring deformation. In previous studies, we developed a residual stress measurement system based on the $cos α$ method, using a two-dimensional (2D) silicon-on-insulator pixel (SOIPIX) detector known as INTPIX4. In a typical laboratory setup, this system requires only 1 second to measure a specified point. This is drastically faster than the conventional system based on the $sin^{2} ψ$ method, which requires more than 10 min, and the $cos α$-based system using an imaging plate, which requires 1 min. Compared to other systems, it can evaluate the 2D distribution of residual stress faster and provide more detailed information for evaluating materials. We first attempted to measure the 2D distribution in a laboratory setup with a Cr X-ray tube (Cr K$α$ 5.4 keV) and obtained satisfactory results. We subsequently took measurements using synchrotron monochromatic X-rays to determine the fine accuracy and fine sampling pitch distribution. In this paper, we report the results of the initial synchrotron experiment, including the residual stress distribution of the standard specimen obtained by the first prototype setup. Furthermore, we compare the synchrotron measurements with those from the laboratory.
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