渐晕效应：一种表征傅里叶叠层成像显微镜的工具
Vignetting Effects: a Tool to Characterize a Fourier Ptychographic Microscope
AI总结：
本研究打破将渐晕视为FPM系统干扰的常规认知，将其作为分析工具，通过表征实验装置组件、对比几何与波动光学模拟，实现了对FPM光学系统几何、相干特性的建模及光瞳像差的部分表征。
摘要：
傅里叶叠层显微术（Fourier Ptychographic Microscopy, FPM）是一项近期出现的技术，它通过对多幅低分辨率图像进行算法后处理，突破了低数值孔径（NA）物镜的衍射极限。该技术能够通过计算融合不同照明条件下采集的图像，提升光学系统的空间带宽积。渐晕决定了采集图像中明场与暗场区域的空间范围，这两类区域分别包含低频与高频图像内容信息。目前最先进的分析方法将渐晕视为一种干扰因素，需要通过特设决策规则将其削弱或排除在算法考量之外[1]。与之相反，本研究将渐晕效应作为一种工具，用于推断光学系统的一系列属性。为实现这一目标，我们表征了实验装置中各个系统组件的特性，并将实验数据分别与几何光学模拟和波动光学模拟进行对比。我们证明，将渐晕用作分析工具能够对光学系统的几何特性与相干特性进行建模，这一点已通过我们的模拟与实验之间的良好吻合得到验证。此外，我们的工作还研究了FPM装置中的光瞳像差，尽管尚未涵盖所有方面，但已能够实现对其的部分表征。
英文摘要：
Fourier Ptychographic Microscopy (FPM) is a recent technique to overcome the diffraction limit of a low numerical aperture (NA) objective lens by algorithmic post-processing of several lower resolved images. It can increase the space-bandwidth product of an optical system by computationally combining images captured under different illumination conditions. Vignetting determines the spatial extent of the bright field and dark field regions in the captured images that contain information about low and high frequency image content, respectively. State-of-the-art analyses treat vignetting as a nuisance that needs to be reduced or excluded from algorithmic consideration by means of ad-hoc decision rules [1]. In contrast, this work investigates vignetting effects as a tool to infer a range of properties of the optical system. To achieve this, we characterize the individual system components of the experimental setup and compare experimental data to both, geometrical and wave optical simulations. We demonstrate that using vignetting as an analytical tool enables the modeling of the geometric and coherence properties of the optical system as evidenced by the good agreement between our simulation and experiment. Moreover, our work investigates pupil aberrations in the FPM setup and enables their partial characterization, despite not yet encompassing all aspects.
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