基于退化模式灵敏度的锂离子电池容量衰减可辨识性研究：面向最小化且直观参数化的电极特异性电池开路电压模型
Identifiability Study of Lithium-Ion Battery Capacity Fade Using Degradation Mode Sensitivity for a Minimally and Intuitively Parametrized Electrode-Specific Cell Open-Circuit Voltage Model
AI总结：
本文通过N/P和Li/P比值重新参数化电极特异性OCV模型，并推导容量衰减的灵敏度梯度，揭示了四个容量限制特征区域，为从不同SOC窗口的OCV测量中辨识锂离子电池退化模式提供了理论依据。
摘要：
当两个电极的开路电位构成全电池OCV（开路电压）模型时，与LLI（锂库存损失）和LAM（活性材料损失）相关的电池级SOH（健康状态）参数自然出现。此类模型已被用于解释实验OCV测量并推断这些与容量衰减相关的SOH参数。在本工作中，我们首先通过N/P（负极与正极容量比）和Li/P（锂与正极容量比）对一个流行的OCV模型公式进行重新参数化，这两个参数具有更对称和直观的物理意义，并且与初始状态无关、与截止电压无关。然后，我们通过数学推导电极滑移和电池OCV相对于这些SOH参数的梯度，研究容量衰减的模态可辨识性，其中电极微分电压分数——表征每个电极对OCV斜率的相对贡献——在将固定截止电压的影响传递到参数灵敏度方面发挥关键作用。总容量的灵敏度梯度还揭示了关于锂库存和活性材料在多大程度上限制表观容量的四个特征区域。我们通过一个关于在不同SOC（荷电状态）窗口下从OCV测量中进行退化模式可辨识性的应用，展示了这些灵敏度梯度的实用性。
英文摘要：
When two electrode open-circuit potentials form a full-cell OCV (open-circuit voltage) model, cell-level SOH (state of health) parameters related to LLI (loss of lithium inventory) and LAM (loss of active materials) naturally appear. Such models have been used to interpret experimental OCV measurements and infer these SOH parameters associated with capacity fade. In this work, we first re-parametrize a popular OCV model formulation by the N/P (negative-to-positive) ratio and Li/P (lithium-to-positive) ratio, which have more symmetric and intuitive physical meaning, and are also pristine-condition-agnostic and cutoff-voltage-independent. We then study the modal identifiability of capacity fade by mathematically deriving the gradients of electrode slippage and cell OCV with respect to these SOH parameters, where the electrode differential voltage fractions, which characterize each electrode's relative contribution to the OCV slope, play a key role in passing the influence of a fixed cutoff voltage to the parameter sensitivity. The sensitivity gradients of the total capacity also reveal four characteristic regimes regarding how much lithium inventory and active materials are limiting the apparent capacity. We show the usefulness of these sensitivity gradients with an application regarding degradation mode identifiability from OCV measurements at different SOC (state of charge) windows.
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