圆柱形多孔陷阱限制介电体的空间电荷电流解析模型
Analytical model of space charge current for a cylindrical porous trap-limited dielectric
AI总结：
本研究推导了平面和圆柱形配置下多孔陷阱限制介电体的空间电荷限制电流解析模型，引入分数阶参数表征多孔性，并利用渡越时间方法确定输运，为介电击穿和有机电子学中的电流-电压测量表征提供了有用工具。
摘要：
在本研究中，推导了平面和圆柱形配置下多孔（或无序）陷阱限制介电体中空间电荷限制电流（SCLC）输运的解析模型。通过将多孔固体视为由小于1的参数a表征的分数阶对象，我们构建了其分数阶电容，并利用渡越时间方法确定了SCLC输运。当a等于1时，它将分别恢复无陷阱和陷阱限制情况下著名的Mott Gurney（MG）定律和Mark Helfrich（MH）定律。对于圆柱形几何结构，我们的研究结果展示了一种传统方法无法获得的解析形式。我们预期所提出的解析模型将成为表征介电击穿和有机电子学中SCLC输运电流-电压测量结果的有用工具，在这些领域中材料的空间多孔性是不可避免的。从这种表征中提取的引入的分数阶参数a可以促进对空间多孔性与电荷迁移率之间关系的定量确定。
英文摘要：
In this study, analytical models for space charge limited current (SCLC) transport in a porous (or disordered) trap-limited dielectric are derived for both planar and cylindrical configuration. By considering the porous solid as a fractional object characterized by a parameter a less than 1, we formulate its fractional capacitance and determine the SCLC transport by using the transit time approach. At a equal to 1, it will recover the well-known Mott Gurney (MG) law and Mark Helfrich (MH) law for trap-free and trap-limited cases, respectively. For cylindrical geometry, our findings show an analytical form that is not available from the traditional methods. We anticipate the proposed analytical model will serve as a useful tool for characterizing the current-voltage measurements in SCLC transport in dielectric breakdown and organic electronics, where spatial porosity of the materials is inevitable. The introduced fractional parameter a extracted from such characterization can facilitate the quantitative determination of the relationship between spatial porosity and charge mobility.
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