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arXiv 2306.03492cs.CV

使用弱监督残差Transformer的工业异常检测与定位

Industrial Anomaly Detection and Localization Using Weakly-Supervised Residual Transformers

Jiangxi Normal University(江西师范大学);Zhejiang University(浙江大学);Anhui University(安徽大学);Swansea University(斯旺西大学)

Hanxi Li, Jingqi Wu, Deyin Liu, Lin Wu, Hao Chen, Mingwen Wang, Chunhua Shen

AI总结:

针对工业异常检测标注成本高的问题,提出弱监督残差Transformer框架WeakREST,通过重构任务、残差特征、弱标注及ResMixMatch算法,在MVTec-AD上取得优于现有方法的检测与定位性能。

摘要:

工业异常检测(AD)领域的最新进展表明,训练阶段引入少量异常样本可显著提升精度,但这种提升通常需要大量标注工作,对许多实际应用而言并不现实。本文提出一种名为弱监督残差Transformer(Weakly-supervised RESidual Transformer, WeakREST)的新型框架,旨在实现高精度异常检测的同时,降低对人工标注的依赖。首先,我们将逐像素异常定位任务重构为逐块分类问题。其次,提出一种名为位置快速异常残差(Positional Fast Anomaly Residuals, PosFAR)的基于残差的特征表示,可更有效地捕捉异常模式。为利用该特征,我们对Swin Transformer进行适配以增强异常检测与定位性能。此外,我们提出一种弱标注方法,利用边界框和图像标签定义异常区域,该方法构建了半监督学习场景,降低了对精确像素级标签的依赖。为进一步优化学习过程,我们提出了全新的ResMixMatch算法,能够处理弱标签与基于残差的表示之间的相互作用。\n在基准数据集MVTec-AD上,我们的方法取得了83.0%的平均精度(AP),超过了无监督设置下此前82.7%的最优结果。在有监督异常检测设置下,WeakREST取得了87.6%的AP,优于此前86.0%的最优结果。值得注意的是,即便使用边界框这类更弱的标注,WeakREST的性能仍超过了依赖逐像素监督的主流方法,在MVTec-AD上取得87.1%的AP,而此前最优结果为86.0%。

英文摘要:

Recent advancements in industrial anomaly detection (AD) have demonstrated that incorporating a small number of anomalous samples during training can significantly enhance accuracy. However, this improvement often comes at the cost of extensive annotation efforts, which are impractical for many real-world applications. In this paper, we introduce a novel framework, Weak}ly-supervised RESidual Transformer (WeakREST), designed to achieve high anomaly detection accuracy while minimizing the reliance on manual annotations. First, we reformulate the pixel-wise anomaly localization task into a block-wise classification problem. Second, we introduce a residual-based feature representation called Positional Fast Anomaly Residuals (PosFAR) which captures anomalous patterns more effectively. To leverage this feature, we adapt the Swin Transformer for enhanced anomaly detection and localization. Additionally, we propose a weak annotation approach, utilizing bounding boxes and image tags to define anomalous regions. This approach establishes a semi-supervised learning context that reduces the dependency on precise pixel-level labels. To further improve the learning process, we develop a novel ResMixMatch algorithm, capable of handling the interplay between weak labels and residual-based representations. On the benchmark dataset MVTec-AD, our method achieves an Average Precision (AP) of $83.0\%$, surpassing the previous best result of $82.7\%$ in the unsupervised setting. In the supervised AD setting, WeakREST attains an AP of $87.6\%$, outperforming the previous best of $86.0\%$. Notably, even when using weaker annotations such as bounding boxes, WeakREST exceeds the performance of leading methods relying on pixel-wise supervision, achieving an AP of $87.1\%$ compared to the prior best of $86.0\%$ on MVTec-AD.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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