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arXiv 2305.04471cond-mat.mes-hallcond-mat.mtrl-sci

基于门控的反射光谱法用于检测二维半导体中的激子物种

Gate-modulated reflectance spectroscopy for detecting excitonic species in two-dimensional semiconductors

Mengsong Xue, Kenji Watanabe, Takashi Taniguchi, Ryo Kitaura

AI总结:

本文提出了一种门控反射光谱技术,用于研究二维过渡金属二硫化物中的激子态,展示了该方法在低温到室温范围内检测激子激发态的高灵敏度。

摘要:

我们开发了一种微光谱技术,用于测量门控反射率以探测二维过渡金属二硫化物中的激子态。成功观察从低温到室温的激子激发态表明,该方法比传统反射光谱法对激子信号更敏感。我们的结果展示了这种反射光谱方法在研究二维过渡金属二硫化物及其异质结构中激子物理的潜力。

英文摘要:

We have developed a microspectroscopy technique for measuring gate-modulated reflectance to probe excitonic states in two-dimensional transition metal dichalcogenides. Successfully observing excited states of excitons from cryogenic to room temperature showed that this method is more sensitive to excitonic signals than traditional reflectance spectroscopy. Our results demonstrated the potential of this reflectance spectroscopy method in studying exciton physics in two-dimensional transition metal dichalcogenides and their heterostructures.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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