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arXiv 2303.14636physics.optics
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纳米结构原位表面增强Kretschmann-Raether椭圆偏振法

Nanostructures for in-situ surface-enhanced Kretschmann-Raether ellipsometry

Deshabrato Mukherjee, Benjamin Kalas, Sven Burger, Gyorgy Safran, Miklos Serenyi, Miklos Fried, Peter Petrik

摘要:

椭偏光谱是一种灵敏的、光学模型支持的界面监测定量工具。在这项工作中,固-液界面研究使用Kretschmann-Raether配置的生物传感应用。界面层同时支持两个目的:(i)用于吸附待检测分子的化学适用性和(ii)信号的光学增强以增加灵敏度。椭偏测量不仅用作传感器,而且还用作定量测量工具,以研究和理解界面现象,并开发传感层以获得最大可能的光学灵敏度。等离子体和结构化层在光学灵敏度方面是最重要的。在横向和垂直方向上的层结构进行了研究。开发了基于传递矩阵和有限元法的光学模型,并用于结构分析,其中材料和几何导数用于模型数据与测量的逆拟合过程。利用等离子体激元,衍射,多层场增强,和其他方法的结构进行了分析,作为可能的候选人的光学性能的改善的细胞。利用Kretschmann-Raether(KR)几何结构,开发了组合和周期性等离子体表面结构,以提高固液界面处的原位椭圆偏振测量的灵敏度。为了提高基于KR排列的传感器的性能,研究了具有可变成分的Ag-$_x$-Al $_{1-x}$层和具有可变周期和临界尺寸的Au层。

英文摘要:

Spectroscopic ellipsometry is a sensitive and optical model-supported quantitative tool to monitor interfaces. In this work, solid-liquid interfaces are studied using the Kretschmann-Raether configuration for biosensing applications. The interface layers support two purposes simultaneously: (i) chemical suitability for the adsorption of molecules to be detected and (ii) the optical enhancement of the signal to increase the sensitivity. Ellipsometry is not only used as a sensor but also as a quantitative measurement tool to study and understand the interface phenomena, and to develop the sensing layers for the largest possible optical sensitivity. Plasmonic and structured layers are of primary importance in terms of optical sensitivity. Layers structured both in lateral and vertical directions have been studied. Optical models based on both the transfer matrix and the finite element method were developed and used for the structural analysis where the material and geometrical derivatives are used in the inverse fitting process of the model data to the measurement. Structures utilizing plasmonic, diffraction, multilayer field enhancement, and other methods were analyzed as possible candidates for the improvement of the optical performance of the cell. Combinatorial and periodic plasmonic surface structures were developed to enhance the sensitivity of in-situ ellipsometry at solid-liquid interfaces utilizing the Kretschmann-Raether (KR) geometry. Ag$_x$Al$_{1-x}$ layers with variable compositions and Au layers with changing periods and critical dimensions were investigated to improve the performance of sensors based on the KR arrangement.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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