We present a design concept for a speckle based wavemeter that combines high spectral resolution and fast response times. Our device uses a fixed disperse medium with small coherence length as an optical pre-processor and a series of programmable optical elements as post-processor. The pre-processor generates a complex speckle pattern with a given correlation length, then the post-processor transforms the optical field to a simple binary pattern with intensity proportional to the wavelength deviation from a reference value. We show how to construct a device which can be trained to produce an electrical signal on a balanced detector proportional to the wavelength. Also, we demonstrate that the device can operate from sub-picometer up to nanometer resolution using a pre-processor with correlation length in the picometer range. More generally, our results show how the use of a programmable optical post-processor with low spectral resolution can be enhanced by a fixed pre-procesor with a higher one.
Fast and Robust Speckle Pattern Authentication by Scale Invariant Feature Transform algorithm in Physical Unclonable Functions
Istituto di Nanoscienze CNR-NANO, Consiglio Nazionale delle Ricerche（意大利国家研究委员会纳米科学研究所）；Istituto di Nanotecnologia CNR-NANOTEC, Consiglio Nazionale delle Ricerche（意大利国家研究委员会纳米技术研究所）；CNR-INO - National Institute of Optics（意大利国家研究委员会光学研究所）；European Laboratory for Non-Linear Spectroscopy (LENS), University of Florence（佛罗伦萨大学非线性光谱学欧洲实验室）；Istituto Nazionale di Ricerca Metrologica (INRiM)（意大利国家计量研究所）
A broadband silicon photonic-integrated-circuit based RF spectrum analyzer with 10 MHz spectral resolution
U.S. Naval Research Laboratory（美国海军研究实验室）；CREOL, The College of Optics and Photonics, University of Central Florida（中佛罗里达大学光学与光子学院CREOL）；Sandia National Laboratories（桑迪亚国家实验室）；AIM Photonics（AIM光子技术）；Center for Integrated Nanotechnologies, Sandia National Laboratories（桑迪亚国家实验室集成纳米技术中心）
