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arXiv 2302.02649physics.opticscond-mat.mtrl-sci
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波导模纳米光学成像研究双轴ReS2晶体的面内各向异性

In-plane anisotropy in biaxial ReS2 crystals probed by nano-optical imaging of waveguide modes

Fabian Mooshammer, Sanghoon Chae, Shuai Zhang, Yinming Shao, Siyuan Qiu, Anjaly Rajendran, Aaron J. Sternbach, Daniel J. Rizzo, Xiaoyang Zhu, P. James Schuck, J… 展开作者

Fabian Mooshammer, Sanghoon Chae, Shuai Zhang, Yinming Shao, Siyuan Qiu, Anjaly Rajendran, Aaron J. Sternbach, Daniel J. Rizzo, Xiaoyang Zhu, P. James Schuck, James C. Hone, D. N. Basov

摘要:

近场成像已成为范德瓦尔斯晶体介电函数的可靠探针。原则上,分析亚波长波导模式(WM)的传播模式允许提取完整的介电张量。然而,以前的研究大多局限于高对称性材料或窄带探测。在这里,我们解决了平面内各向异性的WM在薄硫化铼(ReS 2)晶体在很宽的近红外频率范围。通过追踪这些模式的演化作为晶体学方向,极化的电场和样品厚度的函数,我们已经确定了各向异性介电张量,包括难以捉摸的面外响应。在~1.5 eV处的激子吸收表现为WM色散中的明显回弯特征和品质因数的降低,如数值计算所完全支持的。我们的研究结果扩展了近场显微镜对双轴各向异性的灵敏度,并提供了关键的见解ReS 2的光电性能。

英文摘要:

Near-field imaging has emerged as a reliable probe of the dielectric function of van der Waals crystals. In principle, analyzing the propagation patterns of subwavelength waveguide modes (WMs) allows for extraction of the full dielectric tensor. Yet previous studies have mostly been restricted to high-symmetry materials or narrowband probing. Here, we resolve in-plane anisotropic WMs in thin rhenium disulfide (ReS2) crystals across a wide range of near-infrared frequencies. By tracing the evolution of these modes as a function of crystallographic direction, polarization of the electric field and sample thickness, we have determined the anisotropic dielectric tensor including the elusive out-of-plane response. The excitonic absorption at ~1.5 eV manifests itself as a clear backbending feature in the WM dispersion and a reduction of the quality factors as fully supported by numerical calculations. Our results extend the sensitivity of near-field microscopy towards biaxial anisotropy and provide key insights into the optoelectronic properties of ReS2.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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