导电原子力显微镜中的莫尔条纹
Moiré Fringes in Conductive Atomic Force Microscopy
AI总结：
本研究在铁电材料Er(Mn,Ti)O₃的cAFM扫描中观测到莫尔条纹，证实其为扫描与样品本征属性叠加产生的扫描莫尔效应，为区分莫尔效应来源提供指导，并为提升局域输运测量分辨率提供新路径。
摘要：
莫尔物理在功能材料表征及物理性质调控中发挥着重要作用，研究范围涵盖应变驱动的输运现象到超导等领域。本文中，我们报道了在模型铁电材料Er(Mn,Ti)O₃上开展导电原子力显微镜（cAFM）扫描时观测到的莫尔条纹。通过系统研究扫描角度、像素密度等关键实验参数对所产生莫尔条纹的影响，我们证明观测到的条纹由施加的光栅扫描与样品本征属性叠加产生，将测得的电导调制归类为扫描莫尔效应。我们的发现对利用cAFM研究莫尔工程化材料中的局域输运现象具有重要意义，为区分外在与本征莫尔效应提供了通用指导准则。此外，这些实验为提升灵敏度提供了可行路径，可通过长程莫尔图案探测空间分辨率极限下的电导变化，推动局域输运测量的分辨率极限提升。
英文摘要：
Moiré physics plays an important role for the characterization of functional materials and the engineering of physical properties in general, ranging from strain-driven transport phenomena to superconductivity. Here, we report the observation of moiré fringes in conductive atomic force microscopy (cAFM) scans gained on the model ferroelectric Er(Mn,Ti)O$_3$. By performing a systematic study of the impact of key experimental parameters on the emergent moiré fringes, such as scan angle and pixel density, we demonstrate that the observed fringes arise due to a superposition of the applied raster scanning and sample-intrinsic properties, classifying the measured modulation in conductance as a scanning moiré effect. Our findings are important for the investigation of local transport phenomena in moiré engineered materials by cAFM, providing a general guideline for distinguishing extrinsic from intrinsic moiré effects. Furthermore, the experiments provide a possible pathway for enhancing the sensitivity, pushing the resolution limit of local transport measurements by probing conductance variations at the spatial resolution limit via more long-ranged moiré patterns.
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