氮化硼纳米管、碳纳米管和坡莫合金纳米棒的软X射线光谱重叠成像
Soft X-ray spectro-ptychography on boron nitride nanotubes, carbon nanotubes and permalloy nanorods
摘要：
相对于扫描透射X射线显微镜（STXM）提供的信息，光谱重叠关联成像提供了改进的空间分辨率和附加的相位光谱信息。然而，在软X射线能量的较低范围（例如，低于200 eV至600 eV）对具有弱散射信号的样品的影响可能具有挑战性。我们提出了软X射线重叠关联成像的结果，在低至180 eV的能量和说明的能力与结果坡莫合金纳米棒（Fe 2p），碳纳米管（C 1s），和氮化硼竹纳米结构（B 1s，N1s）。我们描述了低能量X射线光谱重叠关联成像的优化，并讨论了与测量方法，重建算法及其对重建图像的影响相关的重要挑战。本文提出了一种重叠采样时辐射剂量增加的估算方法。
英文摘要：
Spectro-ptychography offers improved spatial resolution and additional phase spectral information relative to that provided by scanning transmission X-ray microscopes (STXM). However, carrying out ptychography at the lower range of soft X-ray energies (e.g., below 200 eV to 600 eV) on samples with weakly scattering signals can be challenging. We present soft X-ray ptychography results at energies as low as 180 eV and illustrate the capabilities with results from permalloy nanorods (Fe 2p), carbon nanotubes (C 1s), and boron nitride bamboo nanostructures (B 1s, N1s). We describe optimization of low energy X-ray spectro-ptychography and discuss important challenges associated with measurement approaches, reconstruction algorithms, and their effects on the reconstructed images. A method for evaluating the increase in radiation dose when using overlapping sampling is presented.
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