存储器地址译码器中的BTI老化恢复
On BTI Aging Rejuvenation in Memory Address Decoders
摘要：
存储器设计需要定时裕度来补偿老化和制造工艺变化。随着技术规模的缩小，老化机制变得更加明显，更大的利润率被认为是必要的。反过来，这意味着更大的面积需求和更低的存储器性能。偏置温度不稳定性（BTI）是老化的主要原因之一，它会减慢晶体管的速度，最终导致永久性故障。在本文中，首先，我们提出了一个低成本的老化缓解方案，它可以应用到现有的硬件，以减轻老化的存储器地址解码器逻辑。我们减轻关键晶体管上的BTI效应，通过应用复兴的工作负载的内存。周期性地执行这样的辅助工作负载以恢复位于地址解码器的关键路线上的晶体管。其次，我们分析工作负载的效率，以优化缓解方案。与现实的基准测试进行的实验结果表明，几倍的生命周期延长，可以忽略不计的执行开销。
英文摘要：
Memory designs require timing margins to compensate for aging and fabrication process variations. With technology downscaling, aging mechanisms became more apparent, and larger margins are considered necessary. This, in return, means a larger area requirement and lower performance for the memory. Bias Temperature Instability (BTI) is one of the main contributors to aging, which slows down transistors and ultimately causes permanent faults. In this paper, first, we propose a low-cost aging mitigation scheme, which can be applied to existing hardware to mitigate aging on memory address decoder logic. We mitigate the BTI effect on critical transistors by applying a rejuvenation workload to the memory. Such an auxiliary workload is executed periodically to rejuvenate transistors that are located on critical paths of the address decoder. Second, we analyze workloads' efficiency to optimize the mitigation scheme. Experimental results performed with realistic benchmarks demonstrate several-times lifetime extension with a negligible execution overhead.
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