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arXiv 2210.09024eess.IVcond-mat.mtrl-scics.CV

Periodic Artifact Reduction in Fourier transforms of Full Field Atomic Resolution Images

Cornell University(康奈尔大学);Brookhaven National Laboratory(布鲁克海文国家实验室)

Robert Hovden, Yi Jiang, Huolin L. Xin, Lena F. Kourkoutis

英文摘要:

The discrete Fourier transform is among the most routine tools used in high-resolution scanning / transmission electron microscopy (S/TEM). However, when calculating a Fourier transform, periodic boundary conditions are imposed and sharp discontinuities between the edges of an image cause a cross patterned artifact along the reciprocal space axes. This artifact can interfere with the analysis of reciprocal lattice peaks of an atomic resolution image. Here we demonstrate that the recently developed Periodic Plus Smooth Decomposition technique provides a simple, efficient method for reliable removal of artifacts caused by edge discontinuities. In this method, edge artifacts are reduced by subtracting a smooth background that solves Poisson's equation with boundary conditions set by the image's edges. Unlike the traditional windowed Fourier transforms, Periodic Plus Smooth Decomposition maintains sharp reciprocal lattice peaks from the image's entire field of view.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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