利用内存芯片的纳米电子特性防止IC伪造
Exploiting Nanoelectronic Properties of Memory Chips for Prevention of IC Counterfeiting
摘要：
本研究提出一种非挥发性记忆体晶片防伪的方法。特别是，我们实验证明了一种通用的方法，用于检测（i）集成电路（IC）的起源，（ii）回收或使用的NVM芯片，和（iii）在芯片中使用的位置（地址）的识别。我们提出的方法检查商业现货（COTS）NVM芯片的延迟和可变性签名。所提出的技术需要低周期（~100）预处理，并利用机器学习（ML）算法。我们观察到不同的趋势，在不同的NVM技术从不同的供应商循环的延迟（扇区擦除或页面写入）的演变。ML辅助方法用于检测IC制造商，在由包括6个不同制造商（9种芯片）的3种不同NVM技术组成的准备好的测试数据集上获得95.1%的准确度。
英文摘要：
This study presents a methodology for anticounterfeiting of Non-Volatile Memory (NVM) chips. In particular, we experimentally demonstrate a generalized methodology for detecting (i) Integrated Circuit (IC) origin, (ii) recycled or used NVM chips, and (iii) identification of used locations (addresses) in the chip. Our proposed methodology inspects latency and variability signatures of Commercial-Off-The-Shelf (COTS) NVM chips. The proposed technique requires low-cycle (~100) pre-conditioning and utilizes Machine Learning (ML) algorithms. We observe different trends in evolution of latency (sector erase or page write) with cycling on different NVM technologies from different vendors. ML assisted approach is utilized for detecting IC manufacturers with 95.1 % accuracy obtained on prepared test dataset consisting of 3 different NVM technologies including 6 different manufacturers (9 types of chips).
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