Picophotonics——超越热涨落的亚原子级光学定位
Picophotonics -- Subatomic Optical Localization Beyond Thermal Fluctuations
AI总结：
本研究提出基于拓扑结构光散射深度学习的非侵入式光学计量方法，以92 pm精度定位热振幅约150 pm的纳米线，实现超越热涨落的亚原子级定位，开启了picophotonics领域。
摘要：
尽管近期光学成像与计量学取得了巨大进展，但原子尺度透射电子显微镜与光学技术之间的分辨率差距仍未弥合。对于表现出布朗运动的纳米结构，能否实现超越热涨落分辨率的光学成像与计量？在此，我们报告了一项实验：在热振荡振幅约为150 pm的纳米线中，使用波长λ = 488 nm的光在单次测量中，以92 pm的精度解析了其平均位置，以约λ/5,300的精度提供了此类亚布朗计量学的首个实例。为了定位该纳米线，我们对拓扑结构光的散射进行了深度学习分析，该方法对纳米线的位置高度敏感。作为一种具有亚布朗绝对误差的非侵入式光学计量技术，其误差低至原子典型尺寸（Si：直径220 pm）的几分之一，它开启了picophotonics这一令人兴奋的领域。
英文摘要：
Despite recent tremendous progress in optical imaging and metrology, the resolution gap between atomic scale transmission electron microscopy and optical techniques has not been closed. Is optical imaging and metrology of nanostructures exhibiting Brownian motion possible with resolution beyond thermal fluctuations? Here we report on an experiment in which the average position of a nanowire with a thermal oscillation amplitude of ~150 pm is resolved in single-shot measurements with precision of 92 pm using light at a wavelength of λ = 488 nm, providing the first example of such sub-Brownian metrology with ~λ/5,300 precision. To localize the nanowire, we employ a deep learning analysis of the scattering of topologically structured light, which is highly sensitive to the nanowire's position. As a non-invasive optical metrology with sub-Brownian absolute errors, down to a fraction of the typical size of an atom (Si: 220 pm diameter), it opens the exciting field of picophotonics.
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