厚宝石临界电荷极限的系统研究
Systematic investigation of critical charge limits in Thick GEMs
摘要：
我们目前的放电概率进行了研究与单一的厚气体电子倍增器（THGEM）与α粒子照射的Ar-CO $_2$和Ne-CO $_2$混合物。我们观察到一个明确的惰性气体和淬灭剂的内容上的放电稳定性的依赖性，指向更轻的气体更稳定的发展流光放电。测量与Geant 4模拟的详细比较使我们能够提取导致在THGEM孔中形成火花的临界电荷值，发现该临界电荷值在3-7个$\times10^6$电子的范围内，取决于气体混合物。我们的实验结果相比，以前的GEM结果。我们发现，放电概率的THGEMs超过一个测量的数量级的GEM。这可以用简单的几何考虑来解释，其中初级电离由THGEM结构中可用的较低数量的孔收集，达到较高的初级电荷密度，从而增加火花发生的概率。然而，我们发现，这两种放大结构的临界电荷限制是相似的。
英文摘要：
We present discharge probability studies performed with a single Thick Gas Electron Multiplier (THGEM) irradiated with alpha particles in Ar-CO$_2$ and Ne-CO$_2$ mixtures. We observe a clear dependency of the discharge stability on the noble gas and quencher content pointing to lighter gases being more stable against the development of streamer discharges. A detailed comparison of the measurements with Geant4 simulations allowed us to extract the critical charge value leading to the formation of a spark in a THGEM hole, which is found to be within the range of 3-7$\times10^6$ electrons, depending on the gas mixture. Our experimental findings are compared to previous GEM results. We show that the discharge probability of THGEMs exceeds the one measured with GEMs by orders of magnitude. This can be explained with simple geometrical considerations, where primary ionization is collected by a lower number of holes available in a THGEM structure, reaching higher primary charge densities and thus increasing the probability of a spark occurrence. However, we show that the critical charge limits are similar for both amplification structures.
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