基于Kirkpatrick-Baez镜光学系统的多功能微聚焦角分辨光电子能谱系统的研制
Development of a versatile micro-focused angle-resolved photoemission spectroscopy system with Kirkpatrick-Baez mirror optics
摘要：
微聚焦束斑角分辨光电子能谱（micro-ARPES）是研究奇异量子材料电子态的有力工具。我们研制了一种基于同步辐射光束与Kirkpatrick-Baez反射镜光学系统聚焦的多功能微型ARPES系统。这些镜子整体安装在一个由五轴运动驱动的平台上，并且与ARPES测量系统振动分离。在Si上的Au光刻图案的空间映射表示在样品位置处的10 $μ$ m（水平）x 12 $μ$ m（垂直）的束斑尺寸，这非常适合于解析局部电子状态中的精细结构。利用微束和高精度的样品运动系统，使准确的空间分辨的能带结构映射，如通过观察与微小的样品弯曲附近的切割的拓扑绝缘体单晶的边缘的小带异常所证明的。
英文摘要：
Angle-resolved photoemission spectroscopy using a micro-focused beam spot (micro-ARPES) is becoming a powerful tool to elucidate key electronic states of exotic quantum materials. We have developed a versatile micro-ARPES system based on synchrotron radiation beam focused with a Kirkpatrick-Baez mirror optics. The mirrors are monolithically installed on a stage, which is driven with five-axes motion, and are vibrationally separated from the ARPES measurement system. Spatial mapping of the Auphotolithography pattern on Si signifies the beam spot size of 10 $μ$m (horizontal) x 12 $μ$m (vertical) at the sample position, which is well suited to resolve the fine structure in local electronic states. Utilization of the micro beam and the high precision sample motion system enables the accurate spatially resolved band-structure mapping, as demonstrated by the observation of a small band anomaly associated with tiny sample bending near the edge of a cleaved topological insulator single crystal.
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