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arXiv 2202.08440cond-mat.stat-mechcond-mat.dis-nn
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随机金属纳米线网络的电导率:分析与计算机模拟

Electrical conductivity of random metallic nanowire networks: An analytical consideration along with computer simulation

Yuri Yu. Tarasevich, Irina V. Vodolazskaya, Andrei V. Eserkepov

摘要:

我们提出了一个分析模型的随机,金属,纳米线网络的电导率。我们模仿这种随机纳米线网络随机电阻网络(RRN)的均匀,各向同性,和随机沉积的导电零宽度棒到绝缘基板上。我们研究了这些RRN的电导率使用平均场近似。的主要物理参数(这些线和它们之间的结的数密度和电阻)的电导率的分析依赖性已被导出。计算机模拟验证了我们的理论预测。我们计算的导电性的RRN对导电填料的数量密度的结电阻为主的情况下,和的情况下,导线电阻和结电阻是相等的。计算结果与此平均场近似进行了比较。我们的计算表明,我们的分析表达式正确地预测了在很宽的数密度范围内的电导率。

英文摘要:

We have proposed an analytical model for the electrical conductivity in random, metallic, nanowire networks. We have mimicked such random nanowire networks as random resistor networks (RRN) produced by the homogeneous, isotropic, and random deposition of conductive zero-width sticks onto an insulating substrate. We studied the electrical conductivity of these RRNs using a mean-field approximation. An analytical dependency of the electrical conductivity on the main physical parameters (the number density and electrical resistances of these wires and of the junctions between them) has been derived. Computer simulations have been performed to validate our theoretical predictions. We computed the electrical conductivity of the RRNs against the number density of the conductive fillers for the junction-resistance-dominated case and for the case where the wire resistance and the junction resistance were equal. The results of the computations were compared with this mean-field approximation. Our computations demonstrated that our analytical expression correctly predicts the electrical conductivity across a wide range of number densities.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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