储氢用CoPd合金中钯稀释极限的电阻率测试
Resistivity testing of palladium dilution limits in CoPd alloys for hydrogen storage
摘要：
钯满足了有效储氢材料的大部分要求，但有两个主要缺点：它具有相对低的重量氢密度，并且对于大规模应用来说过于昂贵。Pd基合金应被视为纯Pd的可能替代品。问题是在保持氢吸收能力的同时，可以在多种候选材料中稀释多少Pd浓度。我们证明，薄膜合金样品的电阻率测量可用于定性高通量筛选和研究的吸氢性能在整个范围内的钯浓度。与富钯合金相反，在富钯合金中，额外的氢散射指示氢含量的程度，稀释的合金膜响应于由于其厚度膨胀而导致的电阻降低。显着的氢吸收的证据被发现在薄CoPd薄膜稀释到只有20%的Pd。
英文摘要：
Palladium satisfies most of the requirements for an effective hydrogen storage material with two major drawbacks: it has a relatively low gravimetric hydrogen density and is prohibitively expensive for large-scale applications. Pd-based alloys should be considered as possible alternatives to a pure Pd. The question is how much one can dilute the Pd concentration in a variety of candidate materials while preserving hydrogen absorption capability. We demonstrate that the resistivity measurements of thin-film alloy samples can be used for a qualitative high-throughput screening and study of the hydrogen-absorbing properties over the entire range of palladium concentrations. Contrary to palladium-rich alloys where additional hydrogen scattering indicates a degree of hydrogen content, the diluted alloy films respond by a decrease of resistance due to their thickness expansion. Evidence of significant hydrogen absorption was found in thin CoPd films diluted to just 20% of Pd.
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