arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2109.06321cs.LG

Mitigating Sampling Bias and Improving Robustness in Active Learning

Intel Labs(英特尔实验室);Intel Corporation(英特尔公司)

Ranganath Krishnan, Alok Sinha, Nilesh Ahuja, Mahesh Subedar, Omesh Tickoo, Ravi Iyer

英文摘要:

This paper presents simple and efficient methods to mitigate sampling bias in active learning while achieving state-of-the-art accuracy and model robustness. We introduce supervised contrastive active learning by leveraging the contrastive loss for active learning under a supervised setting. We propose an unbiased query strategy that selects informative data samples of diverse feature representations with our methods: supervised contrastive active learning (SCAL) and deep feature modeling (DFM). We empirically demonstrate our proposed methods reduce sampling bias, achieve state-of-the-art accuracy and model calibration in an active learning setup with the query computation 26x faster than Bayesian active learning by disagreement and 11x faster than CoreSet. The proposed SCAL method outperforms by a big margin in robustness to dataset shift and out-of-distribution.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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