雾化纳米粒子的电荷态分布
Charge-state distribution of aerosolized nanoparticles
摘要：
在单粒子成像实验中，单个纳米粒子的光束暴露于来自自由电子激光的强烈x射线脉冲，以记录单个孤立分子的衍射图案。用于结构确定的重构依赖于来自许多相同颗粒的信号。因此，为了实现样品均匀性，包括避免电荷多分散性，需要良好定义的样品递送条件。我们已经观察到220纳米聚苯乙烯颗粒的气溶胶束中的充电所产生的气体动力学虚拟喷嘴聚焦技术，而不是故意充电的纳米粒子。在这里，我们提出了一种偏转方法用于检测和表征雾化纳米粒子束的电荷状态。我们使用光学光片定位显微镜和定量粒子轨迹模拟观察到的电荷状态分布的分析是一致的，与以前的描述摩擦带电纳米粒子的倾斜充电概率。
英文摘要：
In single particle imaging experiments, beams of individual nanoparticles are exposed to intense pulses of x-rays from free-electron lasers to record diffraction patterns of single, isolated molecules. The reconstruction for structure determination relies on signal from many identical particles. Therefore, well-defined-sample delivery conditions are desired in order to achieve sample uniformity, including avoidance of charge polydispersity. We have observed charging of 220 nm polystyrene particles in an aerosol beam created by a gas-dynamic virtual nozzle focusing technique, without intentional charging of the nanoparticles. Here, we present a deflection method for detecting and characterizing the charge states of a beam of aerosolized nanoparticles. Our analysis of the observed charge-state distribution using optical light-sheet localization microscopy and quantitative particle trajectory simulations is consistent with previous descriptions of skewed charging probabilities of triboelectrically charged nanoparticles.
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