During the semiconductor manufacturing process, predicting the yield of the semiconductor is an important problem. Early detection of defective product production in the manufacturing process can save huge production cost. The data generated from the semiconductor manufacturing process have characteristics of highly non-normal distributions, complicated missing patterns and high missing rate, which complicate the prediction of the yield. We propose Dirichlet process - naive Bayes model (DPNB), a classification method based on the mixtures of Dirichlet process and naive Bayes model. Since the DPNB is based on the mixtures of Dirichlet process and learns the joint distribution of all variables involved, it can handle highly non-normal data and can make predictions for the test dataset with any missing patterns. The DPNB also performs well for high missing rates since it uses all information of observed components. Experiments on various real datasets including semiconductor manufacturing data show that the DPNB has better performance than MICE and MissForest in terms of predicting missing values as percentage of missing values increases.
Prognostics of Multisensor Systems with Unknown and Unlabeled Failure Modes via Bayesian Nonparametric Process Mixtures
Department of Industrial and Systems Engineering, University of Florida（工业与系统工程系，佛罗里达大学）；School of Forest, Fisheries, and Geomatics Sciences, University of Florida（森林、渔业与地理科学学院，佛罗里达大学）
We introduce a Bayesian approach to predictive density calibration and combination that accounts for parameter uncertainty and model set incompleteness through the use of random calibration functionals and random combination weights. Building on the work of Ranjan, R. and Gneiting, T. (2010) and Gneiting, T. and Ranjan, R. (2013), we use infinite beta mixtures for the calibration. The proposed Bayesian nonparametric approach takes advantage of the flexibility of Dirichlet process mixtures to achieve any continuous deformation of linearly combined predictive distributions. The inference procedu…
Joint space-time wind field data extrapolation and uncertainty quantification using nonparametric Bayesian dictionary learning
Department of Civil and Systems Engineering, Johns Hopkins University, United States of America（约翰霍普金斯大学土木与系统工程系）；Department of Civil Engineering and Engineering Mechanics, Columbia University（哥伦比亚大学土木工程与工程力学系）
Organizations like U.S. Census Bureau rely on non-exhaustive surveys to estimate industry-level production functions in years in which a full Census is not conducted. When analyzing data from non-census years, we propose selecting an estimator based on a weighting of its in-sample and predictive performance. We compare Cobb-Douglas functional assumptions to existing nonparametric shape constrained estimators and a newly proposed estimator. For simulated data, we find that our proposed estimator has the lowest weighted errors. For actual data, specifically the 2010 Chilean Annual National Indus…
The Kernel Manifold: A Geometric Approach to Gaussian Process Model Selection
organization= Department of Materials Science；Engineering, Texas A\&M University , city= College Station , postcode= 77843 , state= TX , country= USA；organization= J. Mike Walker '66 Department of Mechanical Engineering, Texas A\&M University , city= College Station , postcode= 77843 , state= TX , country= USA
The empirical validation of community detection methods is often based on available annotations on the nodes that serve as putative indicators of the large-scale network structure. Most often, the suitability of the annotations as topological descriptors itself is not assessed, and without this it is not possible to ultimately distinguish between actual shortcomings of the community detection algorithms on one hand, and the incompleteness, inaccuracy or structured nature of the data annotations themselves on the other. In this work we present a principled method to access both aspects simultan…
We present a new method for statistical process control (SPC) of a discrete part manufacturing system based on intrinsic geometrical properties of the parts, estimated from three-dimensional sensor data. An intrinsic method has the computational advantage of avoiding the difficult part registration problem, necessary in previous SPC approaches of three-dimensional geometrical data, but inadequate if noncontact sensors are used. The approach estimates the spectrum of the Laplace-Beltrami (LB) operator of the scanned parts and uses a multivariate nonparametric control chart for online process co…
