双电层调制显微术中局域离子浓度变化的计算
Computing the Local Ion Concentration Variations for Electric-Double-Layer-Modulation Microscopy
摘要：
调制导电电极上的电势，以产生散射显微镜，是敏感的表面电荷和局部地形的光学对比度。我们称这种方法为电双层调制显微镜。我们数值计算的本地离子浓度的变化，这是三个实验相关的几何形状的光学对比度的起源：纳米球，纳米线，和纳米孔。在没有等离子体效应和物理吸收的情况下，可观察到的光学对比度与离子浓度相对于调制电势的导数成比例。我们证明，这个衍生物取决于对象的大小，不直观，也对它的表面电荷。这种依赖性是使用这种方法以绝对方式测量表面电荷的关键。我们的研究结果有助于确定实验条件，如动态范围和灵敏度，将是必要的检测元电荷跳跃。我们的结论是，纳米孔是最合适的几何结构，这三个实现元电荷灵敏度。
英文摘要：
Modulating the electric potential on a conducting electrode is presented to generate an optical contrast for scattering microscopy that is sensitive to both surface charge and local topography. We dub this method Electric-Double-Layer-Modulation microscopy. We numerically compute the change in the local ion concentration that is the origin of this optical contrast for three experimentally relevant geometries: nanosphere, nanowire, and nanohole. In absence of plasmonic effects and physical absorption, the observable optical contrast is proportional to the derivative of the ion concentration with respect to the modulated potential. We demonstrate that this derivative depends on the size of the object and, less intuitively, also on its surface charge. This dependence is key to measuring the surface charge, in an absolute way, using this method. Our results help to identify the experimental conditions such as dynamic range and sensitivity that will be necessary for detecting the elementary charge jumps. We conclude that the nanohole is the most suitable geometry among these three for achieving elementary charge sensitivity.
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