利用强X射线脉冲实现高分辨率和元素衬度的荧光强度关联成像
Fluorescence intensity correlation imaging with high resolution and elemental contrast using intense x-ray pulses
AI总结：
该研究理论分析强XFEL脉冲下Ar团簇与掺Mo氧化铁纳米颗粒的FIC，证明数飞秒脉冲即可获得高分辨率结构，并可利用Mo荧光实现元素特异性掺杂分布成像。
摘要：
我们从理论上研究了Ar团簇和掺Mo氧化铁纳米颗粒在强飞秒及亚飞秒XFEL脉冲作用下的荧光强度关联（FIC），以实现高分辨率和元素衬度成像。我们给出了Ar团簇中Kα和Kα_h发射的FIC，讨论了样品损伤对恢复高分辨率结构信息的影响，并将所得结构信息与相干衍射成像（CDI）方法获得的信息进行比较。我们发现，尽管亚飞秒脉冲将显著有利于CDI方法，但数飞秒脉冲可能足以通过FIC获得高分辨率信息。此外，我们表明，由掺Mo氧化铁纳米颗粒中Mo原子的荧光计算得到的荧光强度关联可用于对掺杂剂分布进行成像。
英文摘要：
We theoretically investigate the fluorescence intensity correlation (FIC) of Ar clusters and Mo-doped iron oxide nanoparticles subjected to intense, femtosecond and sub-femtosecond XFEL pulses for high-resolution and elemental contrast imaging. We present the FIC of {\Ka} and {\Kah} emission in Ar clusters and discuss the impact of sample damage on retrieving high-resolution structural information and compare the obtained structural information with those from the coherent difractive imaging (CDI) approach. We found that, while sub-femtosecond pulses will substantially benefit the CDI approach, few-femtosecond pulses may be sufficient for achieving high-resolution information with FIC. Furthermore, we show that the fluorescence intensity correlation computed from the fluorescence of Mo atoms in Mo-doped iron oxide nanoparticles can be used to image dopant distributions.
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