Pendellösung干涉法探测中子电荷半径、晶格动力学和第五力
Pendellösung Interferometry Probes the Neutron Charge Radius, Lattice Dynamics, and Fifth Forces
摘要：
结构因子描述入射辐射如何从诸如硅和锗的材料散射，并表征材料和散射粒子之间的物理相互作用。我们使用中子摆振干涉法对（220）和（400）中子-硅结构因子进行了精确测量，并将（111）结构因子的不确定度提高了四倍。这些数据提供了室温下硅Debye-Waller因子和均方中子电荷半径$\langle r_n^2 \rangle = -0.1101 \pm 0.0089 \, \mathrm{fm}^2$的测量结果。结合现有的德拜-沃勒因子和电荷半径的测量，测量的结构因子也提高了对Yukawa修改重力强度的约束，在20 pm至10 nm的长度尺度范围内提高了一个数量级。
英文摘要：
Structure factors describe how incident radiation is scattered from materials such as silicon and germanium and characterize the physical interaction between the material and scattered particles. We use neutron pendellösung interferometry to make precision measurements of the (220) and (400) neutron-silicon structure factors, and achieve a factor of four improvement in the (111) structure factor uncertainty. These data provide measurements of the silicon Debye-Waller factor at room temperature and the mean square neutron charge radius $\langle r_n^2 \rangle = -0.1101 \pm 0.0089 \, \mathrm{fm}^2$. Combined with existing measurements of the Debye-Waller factor and charge radius, the measured structure factors also improve constraints on the strength of a Yukawa-modification to gravity by an order of magnitude over the 20 pm to 10 nm length scale range.
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