扫描量子点显微镜的控制
Control of Scanning Quantum Dot Microscopy
摘要：
扫描量子点显微镜是一种基于原子力显微镜的高分辨率显微镜技术，能够对分子或单个原子等纳米结构的静电势进行成像。最近，它可以表明，它不仅产生定性，而且定量切割边缘图像，甚至在原子水平上。在本文中，我们提出如何控制是一个关键的使能元素。所开发的控制方法包括一个两个自由度的控制框架，包括一个前馈和反馈部分。对于后者，我们设计了两个定制的反馈控制器。前馈部分基于先前扫描的行生成当前扫描的行的参考。我们详细讨论了所提出的控制方法及其对扫描量子点显微镜的影响的各个方面。我们评估的前馈部分的影响，并比较两个建议的反馈控制器。所提出的控制算法将扫描量子点显微镜的速度提高了一个数量级以上，并且能够扫描大的样品区域。
英文摘要：
Scanning quantum dot microscopy is a recently developed high-resolution microscopy technique that is based on atomic force microscopy and is capable of imaging the electrostatic potential of nanostructures like molecules or single atoms. Recently, it could be shown that it not only yields qualitatively but also quantitatively cutting edge images even on an atomic level. In this paper we present how control is a key enabling element to this. The developed control approach consists of a two-degree-of-freedom control framework that comprises a feedforward and a feedback part. For the latter we design two tailored feedback controllers. The feedforward part generates a reference for the current scanned line based on the previously scanned one. We discuss in detail various aspects of the presented control approach and its implications for scanning quantum dot microscopy. We evaluate the influence of the feedforward part and compare the two proposed feedback controllers. The proposed control algorithms speed up scanning quantum dot microscopy by more than a magnitude and enable to scan large sample areas.
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